GBT 33720-2017 "LED lighting products luminous flux attenuation accelerated test method" released
On May 12, 2017, the National Standards Committee issued the "National Standards of the People's Republic of China Announcement No. 11 of 2017", the national standard GB/T 33720-2017 "Lighting Flux Attenuation of LED Lighting Products" led by the National Key Laboratory of Semiconductor Lighting Innovation. The Accelerated Test Method is released and will be implemented on December 1, 2017. On May 12, 2017, the National Standards Committee issued the "National Standards of the People's Republic of China Announcement No. 11 of 2017", the national standard GB/T 33720-2017 "Lighting Flux Attenuation of LED Lighting Products" led by the National Key Laboratory of Semiconductor Lighting Innovation. The Accelerated Test Method is released and will be implemented on December 1, 2017. GB/T 33720-2017 "Lighting Flux Attenuation Accelerated Test Method for LED Lighting Products" is a national key laboratory of semiconductor lighting joint innovation, and the conversion of the results of the reliability test and analysis common research project of semiconductor lighting products, in order to quickly and effectively judge the luminous flux attenuation of LED lighting products. The feature provides a set of easy and reasonable detection methods, which can shorten the traditional 6000h test time to less than 2000h without affecting the accuracy of reliability evaluation, and the color stability of LED lighting products, as well as other subsystems such as power supply. The drive, heat dissipation structure and secondary optics design establish basic reliability requirements and can be widely applied to most indoor LED lighting fixtures, road lighting fixtures and special lighting fixtures on the market. This standard saves a lot of testing time for China's LED lighting enterprises, which is of great significance for reducing the research and development cycle and cost of enterprises and accelerating the development of LED lighting industry. This standard was drafted: National Key Laboratory of Semiconductor Lighting Joint Innovation (Beijing Semiconductor Lighting Technology Promotion Center), Changzhou Wujin District Semiconductor Lighting Application Technology Research Institute, Hebei Lide Electronics Co., Ltd., Shanghai Times Light Lighting Electrical Testing Co., Ltd. Institute of Semiconductors, Chinese Academy of Sciences, Hangzhou Yuanfang Optoelectronic Information Co., Ltd., National Semiconductor Device Quality Supervision and Inspection Center, Guangzhou Saixi Standard Testing and Research Institute Co., Ltd., Xiamen Hualian Electronics Co., Ltd., Foshan Guoxing Optoelectronics Co., Ltd., Guangdong De Hao Runda Electric Co., Ltd., Huizhou NVC Optoelectronics Technology Co., Ltd., Nanjing Handerson Technology Co., Ltd., Ningbo Liaoyuan Lighting Co., Ltd., Ningbo Shengpu Optoelectronics Semiconductor Co., Ltd., Sanan Optoelectronics Co., Ltd., Shanxi Coslight Semiconductor Lighting Co., Ltd., Shanghai Yaming Lighting Co., Ltd., Sichuan Jiuzhou Optoelectronics Technology Co., Ltd., Wuxi Huazhao Optoelectronics Technology Co., Ltd., Shenzhen Lehman Optoelectronics Technology Co., Ltd., Shenzhen Zhouming Technology Co., Ltd. The main drafters of this standard: Yuan Changan, Qian Cheng, Fan Xuejun, Zhang Guoqi, Xu Shaowei, Li Bo, Zhou Qi, Zhu Xiaodong, Huang Jie, Yu Anqi, Gao Wei, Fan Jiajie, Li Jinxi, Wang Junxi, Zhao Lixia, Pan Jiangen, Zhao Yibing, Zhou Gang, Chen Jie, Li Cheng, Xie Wei, Xiong Fei, Han Licheng, Sun Jianjiang, Niu Hongqiang, Cai Weizhi, Xu Min, Zhu Huarong, Zhong Xiong, Chang Baoyan, Tu Menglong, Li Jianghai, Li Zhijiang, Huang Heming.
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